| 1. | ![]() |
2. | ![]() |
| 3. | ![]() |
4. | ![]() |
| 1. | (\(A\) AND \(B\)) | 2. | (\(A\) OR \(B\)) |
| 3. | (\(B\) OR \(C\)) | 4. | none of the above |
| 1. | increases. |
| 2. | decreases. |
| 3. | remains constant. |
| 4. | may increase or decrease depending on bias. |
| 1. | flow in the direction of the \(\vec{E}\) and cause a current opposite to \(\vec{E}\) |
| 2. | flow opposite to \(\vec{E}\) and cause a current along \(\vec{E}\) |
| 3. | flow along \(\vec{E}\) and cause a current along \(\vec{E}\) |
| 4. | flow opposite to \(\vec{E}\) and cause a current opposite to \(\vec{E}\) |
| Statement I: | If the current through the diode increases, then the dynamic resistance decreases. |
| Statement II: | If the temperature of the diode is increased, with the potential difference fixed, the dynamic resistance decreases. |
| 1. | Statement I is incorrect and Statement II is correct. |
| 2. | Both Statement I and Statement II are correct. |
| 3. | Both Statement I and Statement II are incorrect. |
| 4. | Statement I is correct and Statement II is incorrect. |
| 1. | \(A\) AND \(B\) | 2. | \(A\) OR \(B\) |
| 3. | \(A\) | 4. | \(B\) |
| List-I | List-II | ||
| (a) | Intrinsic semiconductor | (e) | Prepared by adding phosphorus |
| (b) | \(\mathrm{n}\text-\)type semiconductor | (f) | The width is nearly one micron |
| (c) | \(\mathrm{p}\text-\)type semiconductor | (g) | Silicon |
| (d) | Depletion layer | (h) | Prepared by adding indium |
| 1. | (a)-(g), (b)-(e), (c)-(h), (d)-(f) |
| 2. | (a)-(h), (b)-(f), (c)-(e), (d)-(g) |
| 3. | (a)-(e), (b)-(g), (c)-(f), (d)-(h) |
| 4. | (a)-(f), (b)-(h), (c)-(g), (d)-(e) |

| 1. | only \(D_3\) | 2. | \(D_1\) and \(D_3\) |
| 3. | all of the diodes | 4. | none of the diodes |
